RANCANG BANGUN PERANGKAT UJI KUALITAS KOMPONEN INTEGRATED CIRCUIT (IC) DIGITAL BERBASIS MIKROKONTROLER ATMEGA32

Authors

  • Tiffany Br. Lumban Tobing
  • Ahmad Dani Hariawan

Abstract

Integrated Circuit (IC) is often a key component in building an electronic circuit, especially digital electronics. That's why the quality of the performance of an IC directly is also important. But in reality, IC purchased by consumers are not always in good condition. When buying, the consumer does not know for sure whether the IC is still in good condition or are already contained in the partial or total destruction. Similar problems are found in the sphere of activity of electronic learning in college. Electronic’s lab activities involve the practice of designing and testing circuits. In the process, there are many IC reused. In some observations, which have been resolved circuit was not working properly. The cause then known from the use of the IC is damaged, both before and after the soldered components on the circuit board. Perpetrators of electronic activities such as repair and electronics hobbyists are also experiencing similar problems. All IC indicated damaged discarded, although the damage is not the whole part. The impact of this issue is not only a loss on the user side, but also the risk of damage to the entire circuit is mounted. This research aims to design and create a digital IC tester that can perform accuracy checks each IC logic functions based on the truth table. The input signal is formed from a microcontroller ATmega32, and then outputs the measurement results displayed on the LCD. As an interface for the user to set a series of IC being tested, the device includes a matrix keypad and buzzer. This device can then be used as a supporting device digital electronics lab activity in Medan LP3I Polytechnic campus environment, and can be used as an enrichment of teaching materials regarding the application and programming the microcontroller in the Engineering Department of Electronics and Computer Engineering.
Keywords: Digital, IC tester, microcontroller

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Published

2017-01-16