Implementasi Metode Naive Bayes Classifier dalam Menentukan Diagnosa Kerusakan pada Smartphone

Adam Perdana Septyana; Esa Fauzi

doi:10.30865/json.v7i1.8926

Authors

Adam Perdana Septyana Universitas Widyatama
Esa Fauzi Universitas Widyatama

DOI:

https://doi.org/10.30865/json.v7i1.8926

Keywords:

, Kerusakan Smartphone, Machine Learning, Naive Bayes, Sistem Diagnosa, Prediksi Kerusakan, Probabilitas kerusakan

Abstract

Kerusakan pada smartphone merupakan permasalahan umum yang sering dialami oleh pengguna, namun tidak semua pengguna memahami solusi yang tepat atas permasalahan tersebut. Oleh karena itu, dibutuhkan suatu sistem yang dapat membantu dalam mendiagnosa kerusakan smartphone secara cepat dan akurat. Teknologi machine learning dapat dimanfaatkan untuk membantu teknisi dalam proses diagnosis dengan menggunakan metode Naive Bayes Classifier. Metode ini menggunakan empat atribut utama dalam menentukan probabilitas kerusakan, yaitu kronologi, merek smartphone, konsumsi arus listrik, dan gejala. Naive Bayes dipilih karena kesederhanaannya, kemampuannya dalam menangani data yang tidak seimbang, serta kinerjanya yang baik dalam klasifikasi. Data gejala dan jenis kerusakan diperoleh dari teknisi smartphone dan literatur relevan. Sistem ini diharapkan dapat menjadi alat bantu bagi pengguna maupun teknisi dalam melakukan identifikasi awal terhadap kerusakan smartphone secara lebih efisien dan akurat.

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